奕叶探针座EB-050

螺杆密度标准:80TPI螺杆牙的间矩318微米螺杆牙的间矩.精度0.9micron 螺杆密度选配:100TPI螺杆牙的间矩250微米螺杆牙的间矩.精度0.7micron

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四点探针台

奕叶探针台(EVERBEING)四点探针台适用于表面电阻率测试、薄膜切片电阻率测试、半导体掺杂特性的测试、金属层厚度的测试、测试半导体类型：P型 N型、电压 电流的测试。

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奕叶探针座EB-700

螺杆密度标准：40TPI螺杆牙的间矩500micron微米螺杆牙的间矩.精度3微米

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奕叶屏蔽箱

屏蔽电磁干扰、光线干扰，保证半导体特性测试的准确与稳定

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加热卡盘

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EB-700探针座

EB系列探针座是线性移动，有些仿制的探针座，在探针移动的时候，走的是蛇行的路线，给精确点针造成困难。    奕叶探针台是目前台湾地区唯一一家采用瑞士螺纹的探针台。

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EB-005探针座

精度高，可靠性非常好

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高阻抗探针杆Model 34A Active Probe

This high impedance probe combines full DC capability, rise/fall times of 120 ps, and a nominal loading input impedance of 10 megohm shunted by 0.1 pf. Signal attenuation is 20:1 with a 50 ohm oscilloscope input. Like our other active probes, the Model 34A achieves its bandwidth using just one probe point, which greatly simplifies internal node testing without sacrificing performance. An assortment of user replaceable probe tips are available for a variety of probing needs. The Model 34A is powered by our standard Picoprobe® power supply.

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